Runaway Electron Risk in DTT Full Power Scenario
Published:Dec 31, 2025 10:09
•1 min read
•ArXiv
Analysis
This paper highlights a critical safety concern for the DTT fusion facility as it transitions to full power. The research demonstrates that the increased plasma current significantly amplifies the risk of runaway electron (RE) beam formation during disruptions. This poses a threat to the facility's components. The study emphasizes the need for careful disruption mitigation strategies, balancing thermal load reduction with RE avoidance, particularly through controlled impurity injection.
Key Takeaways
- •Full power operation of DTT significantly increases the risk of runaway electron beam formation during disruptions.
- •The avalanche multiplication factor is a key parameter driving this risk.
- •Disruption mitigation strategies must balance thermal load reduction and runaway electron avoidance.
- •Careful impurity injection is crucial for managing runaway electron generation.
Reference
“The avalanche multiplication factor is sufficiently high ($G_ ext{av} \approx 1.3 \cdot 10^5$) to convert a mere 5.5 A seed current into macroscopic RE beams of $\approx 0.7$ MA when large amounts of impurities are present.”