Analyzing Charge Transport in Amorphous Semiconductors using Time-of-Flight Photocurrent

This research investigates fundamental properties of amorphous semiconductors, vital for understanding and improving various electronic devices. The methodology utilizes time-of-flight photocurrent analysis, a standard technique for probing charge transport dynamics.

• •Focuses on fundamental semiconductor properties.
• •Employs time-of-flight photocurrent analysis.
• •Contributes to understanding of electronic devices.